"An efficient parameter extraction method using statistical optimization in ..."

Alex Yoondong Park et al. (2002)

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DOI: 10.1109/ISCAS.2002.1010683

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-25

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  - conf/iscas/ParkJSYK02
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Alex Yoondong Park, Steve H. Jen, Bing J. Sheu, Heesook Yoon, In Gyeom Kim:
An efficient parameter extraction method using statistical optimization in S-CMOS deep-submicron/nanometer model. ISCAS (5) 2002: 233-236

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