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"Resolving Unusual Gate Current and Dielectric Breakdown of Solution ..."
Sean F. Romanuik et al. (2022)
- Sean F. Romanuik, Bishakh Rout, Pierre-Luc Girard-Lauriault, Sharmistha Bhadra:
Resolving Unusual Gate Current and Dielectric Breakdown of Solution Processed Carbon Nanotube Thin Film Transistor. ISCAS 2022: 2008-2011
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