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"A substrate noise circuit for accurately testing mixed-signal ICs."

Weize Xu, Eby G. Friedman (2002)

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DOI: 10.1109/ISCAS.2002.1009798

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Weize Xu, Eby G. Friedman:
A substrate noise circuit for accurately testing mixed-signal ICs. ISCAS (1) 2002: 145-148

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