"Variation-aware gate sizing and clustering for post-silicon optimized ..."

Cheng Zhuo, David T. Blaauw, Dennis Sylvester (2008)

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DOI: 10.1145/1393921.1393949

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Cheng Zhuo, David T. Blaauw, Dennis Sylvester:
Variation-aware gate sizing and clustering for post-silicon optimized circuits. ISLPED 2008: 105-110

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