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"The Evaluation of Full Sensitivity for Test Generation in MVL Circuits."

Elena Dubrova, Dilian Gurov, Jon C. Muzio (1995)

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DOI: 10.1109/ISMVL.1995.513517

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ismvl/DubrovaGM95
Elena Dubrova, Dilian Gurov, Jon C. Muzio:
The Evaluation of Full Sensitivity for Test Generation in MVL Circuits. ISMVL 1995: 104-111

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