"A New Flip-flop Shared Architecture of Test Point Insertion for Scan Design."

Hyemin Kim et al. (2023)

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DOI: 10.1109/ISOCC59558.2023.10396072

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-10

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Hyemin Kim, Sangjun Lee, Jongho Park, Sungwhan Park, Sungho Kang:
A New Flip-flop Shared Architecture of Test Point Insertion for Scan Design. ISOCC 2023: 343-344

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