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"FAME: Fault Address Memory Structure for Repair Time Reduction."

Hayoung Lee et al. (2022)

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DOI: 10.1109/ISOCC56007.2022.10031369

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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  dblp key:
  - conf/isocc/LeeLYSK22a
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Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
FAME: Fault Address Memory Structure for Repair Time Reduction. ISOCC 2022: 31-32

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