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"Diagnosis of Scan Chain Faults Based-on Machine-Learning."

Hyeonchan Lim et al. (2020)

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DOI: 10.1109/ISOCC50952.2020.9333074

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-15

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  dblp key:
  - conf/isocc/LimKKK20
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  - https://dblp.org/rec/conf/isocc/LimKKK20
Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang:
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC 2020: 57-58

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