"Dielectric excitation of Metal Oxide Semiconductor sensors: an exploratory ..."

Stefano Robbiani et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ISOEN61239.2024.10556111

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isoen/RobbianiBCMD24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isoen/RobbianiBCMD24
Stefano Robbiani, Alessandro Benegiamo, Laura Capelli, Santiago Marco, Raffaele L. Dellacà:
Dielectric excitation of Metal Oxide Semiconductor sensors: an exploratory performances analysis. ISOEN 2024: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.