"Function-Based Test Generation for (Non-Robust) Path Delay Faults Using ..."

Rajsekhar Adapa et al. (2007)

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DOI: 10.1109/ISQED.2007.81

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, Michael Laisne, Hailong Cui, Tsvetomir Petrov:
Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture. ISQED 2007: 717-722

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