"Die/wafer stacking with reciprocal design symmetry (RDS) for mask reuse in ..."

Syed M. Alam et al. (2009)

Details and statistics

DOI: 10.1109/ISQED.2009.4810357

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics