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"Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate."

Harmander Deogun, Dennis Sylvester, David T. Blaauw (2005)

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DOI: 10.1109/ISQED.2005.61

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/isqed/DeogunSB05
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/DeogunSB05
Harmander Deogun, Dennis Sylvester, David T. Blaauw:
Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate. ISQED 2005: 175-180

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