"A Versatile High Speed Bit Error Rate Testing Scheme."

Yongquan Fan, Zeljko Zilic, Man Wah Chiang (2004)

Details and statistics

DOI: 10.1109/ISQED.2004.1283706

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics