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"TASSER: A temperature-aware statistical soft-error-rate analysis framework ..."

Sung S.-Y. Hsueh, Ryan H.-M. Huang, Charles H.-P. Wen (2014)

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DOI: 10.1109/ISQED.2014.6783372

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

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Sung S.-Y. Hsueh, Ryan H.-M. Huang, Charles H.-P. Wen:
TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits. ISQED 2014: 529-534

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