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"Test set identification for improved delay defect coverage in the presence ..."
Pavan Kumar Javvaji, Basim Shanyour, Spyros Tragoudas (2018)
- Pavan Kumar Javvaji, Basim Shanyour, Spyros Tragoudas:
Test set identification for improved delay defect coverage in the presence of statistical delays. ISQED 2018: 14-19

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