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"Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM ..."

Rouwaida Kanj et al. (2007)

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DOI: 10.1109/ISQED.2007.83

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/isqed/KanjJSKANMN07
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  - https://dblp.org/rec/conf/isqed/KanjJSKANMN07
Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif:
Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40

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