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ORCID"A unified FinFET reliability model including high K gate stack dynamic ..."
Chenyue Ma et al. (2009)
- Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan
:
A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12
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