"Vertically-addressed test structures (VATS) for 3D IC variability and ..."

Conor O'Sullivan, Peter M. Levine, Siddharth Garg (2013)

Details and statistics

DOI: 10.1109/ISQED.2013.6523596

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

a service of  Schloss Dagstuhl - Leibniz Center for Informatics