"Full-Chip Signal Interconnect Analysis for Electromigration Reliability."

Steffen Rochel, N. S. Nagaraj (2000)

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DOI: 10.1109/ISQED.2000.838893

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Steffen Rochel, N. S. Nagaraj:
Full-Chip Signal Interconnect Analysis for Electromigration Reliability. ISQED 2000: 337-340

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