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"Design for Testability in Nanometer Technologies; Searching for Quality."

Thomas W. Williams, Rohit Kapur (2000)

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DOI: 10.1109/ISQED.2000.838870

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/WilliamsK00
Thomas W. Williams, Rohit Kapur:
Design for Testability in Nanometer Technologies; Searching for Quality. ISQED 2000: 167-172

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