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"8.7 Physically unclonable function for secure key generation with a key ..."
Bohdan Karpinskyy et al. (2016)
- Bohdan Karpinskyy, Yongki Lee, Yunhyeok Choi, Yongsoo Kim, Mijung Noh, Sanghyun Lee:
8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips. ISSCC 2016: 158-160
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