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"18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O ..."

Young Jun Yoon et al. (2016)

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DOI: 10.1109/ISSCC.2016.7418036

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-10

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  - conf/isscc/YoonJKKLKSKHKKL16
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  - https://dblp.org/rec/conf/isscc/YoonJKKLKSKHKKL16
Young Jun Yoon, Byung Deuk Jeon, Byung Soo Kim, Ki Up Kim, Tae Yong Lee, Nohhyup Kwak, Woo-Yeol Shin, Na Yeon Kim, Yunseok Hong, Kyeong Pil Kang, Dong Yoon Ka, Seong Ju Lee, Yong Sun Kim, Young Kyu Noh, Jaehoon Kim, Dong Keum Kang, Ho Uk Song, Hyeon Gon Kim, Jonghoon Oh:
18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O test scheme. ISSCC 2016: 320-322

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