"Themis: Automatic and Efficient Deep Learning System Testing with Strong ..."

Dong Huang et al. (2024)

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DOI: 10.1109/ISSRE62328.2024.00050

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Dong Huang, Tsz On Li, Xiaofei Xie, Heming Cui:
Themis: Automatic and Efficient Deep Learning System Testing with Strong Fault Detection Capability. ISSRE 2024: 451-462

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