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"Smart defect classification for better analysis using tagging mechanisms."

Seema Meena, Uma M. Balasubramani (2013)

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DOI: 10.1109/ISSREW.2013.6688871

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Seema Meena, Uma M. Balasubramani:
Smart defect classification for better analysis using tagging mechanisms. ISSRE (Supplemental Proceedings) 2013: 57

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