"Generating Storage-Aware Test Sets Targeting Several Fault Models."

Hari Addepalli et al. (2024)

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DOI: 10.1109/ISVLSI61997.2024.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-01

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Hari Addepalli, Irith Pomeranz, M. Enamul Amyeen, Suriyaprakash Natarajan, Arani Sinha, Srikanth Venkataraman:
Generating Storage-Aware Test Sets Targeting Several Fault Models. ISVLSI 2024: 15-20

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