"Process Variation and NBTI Tolerant Standard Cells to Improve Parametric ..."

Shubhankar Basu, Ranga Vemuri (2007)

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DOI: 10.1109/ISVLSI.2007.85

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shubhankar Basu, Ranga Vemuri:
Process Variation and NBTI Tolerant Standard Cells to Improve Parametric Yield and Lifetime of ICs. ISVLSI 2007: 291-298

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