"Impact of Circuit Degradation on FPGA Design Security."

Han-Wei Chen et al. (2011)

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DOI: 10.1109/ISVLSI.2011.81

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Han-Wei Chen, Suresh Srinivasan, Yuan Xie, Vijaykrishnan Narayanan:
Impact of Circuit Degradation on FPGA Design Security. ISVLSI 2011: 230-235

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