"Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB ..."

Amit Karel et al. (2016)

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DOI: 10.1109/ISVLSI.2016.102

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-19

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Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell:
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. ISVLSI 2016: 164-169

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