"Reduction of Power and Test Time by Removing Cluster of Don't-Care from ..."

Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler (2005)

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DOI: 10.1109/ISVLSI.2005.63

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-28

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Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler:
Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI 2005: 255-256

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