"Simultaneous Gate Sizing and Skew Scheduling to Statistical Yield Improvement."

Minoo Mirsaeedi, Morteza Saheb Zamani, Mehdi Saeedi (2008)

Details and statistics

DOI: 10.1109/ISVLSI.2008.69

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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