"Dependability Analysis of Nano-scale FinFET circuits."

Feng Wang et al. (2006)

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DOI: 10.1109/ISVLSI.2006.35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Feng Wang, Yuan Xie, Kerry Bernstein, Yan Luo:
Dependability Analysis of Nano-scale FinFET circuits. ISVLSI 2006: 399-404

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