"Mitigating NBTI Degradation on FinFET GPUs through Exploiting Device ..."

Ying Zhang et al. (2014)

> Home

Details and statistics

DOI: 10.1109/ISVLSI.2014.21

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/isvlsi/ZhangCPC14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isvlsi/ZhangCPC14
Ying Zhang, Sui Chen, Lu Peng, Shaoming Chen:
Mitigating NBTI Degradation on FinFET GPUs through Exploiting Device Heterogeneity. ISVLSI 2014: 577-582

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.