"Wafer Map Pattern Analytics Driven By Natural Language Queries."

Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang (2022)

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DOI: 10.1109/ITCASIA55616.2022.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-21

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Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang:
Wafer Map Pattern Analytics Driven By Natural Language Queries. ITC-Asia 2022: 31-36

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