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ORCID"2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, ..."
Scott Davidson, Anne Gattiker (2006)
- Scott Davidson, Anne Gattiker:
2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. IEEE Computer Society 2006, ISBN 1-4244-0292-1 [contents]
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