Stop the war!
default search action
"2008 IEEE International Test Conference, ITC 2008, Santa Clara, ..."
Douglas Young, Nur A. Touba (2008)
- Douglas Young, Nur A. Touba:
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. IEEE Computer Society 2008, ISBN 978-1-4244-2403-0 [contents]
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.