"2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, ..."

Gordon W. Roberts, Bill Eklow (2009)

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type: Editorship

metadata version: 2019-10-16

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Gordon W. Roberts, Bill Eklow:
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE Computer Society 2009, ISBN 978-1-4244-4868-5 [contents]

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