"Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks."

Zahi S. Abuhamdeh et al. (2006)

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DOI: 10.1109/TEST.2006.297656

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/AbuhamdehPRCH06
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  - https://dblp.org/rec/conf/itc/AbuhamdehPRCH06
Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan:
Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC 2006: 1-8

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