"Delay Monitoring Under Different PVT Corners for Test and Functional ..."

Hari Addepalli et al. (2024)

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DOI: 10.1109/ITC51657.2024.00035

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Hari Addepalli, Jiezhong Wu, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski:
Delay Monitoring Under Different PVT Corners for Test and Functional Operation. ITC 2024: 157-166

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