"Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor."

M. Enamul Amyeen et al. (2004)

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DOI: 10.1109/TEST.2004.1387328

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee:
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678

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