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"Layout-aware 2-step window-based pattern reordering for fast bridge/open ..."

Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki (2017)

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DOI: 10.1109/TEST.2017.8242060

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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Masayuki Arai, Shingo Inuyama, Kazuhiko Iwasaki:
Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation. ITC 2017: 1-8

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