default search action
"Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits."
Peter S. Bottorff (1982)
- Peter S. Bottorff:
Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits. ITC 1982: 24
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.