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"Integrated Pin Electronics for a VLSI Test System."

Christopher W. Branson, Don Murray, Steve Sullivan (1988)

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DOI: 10.1109/TEST.1988.207776

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Christopher W. Branson, Don Murray, Steve Sullivan:
Integrated Pin Electronics for a VLSI Test System. ITC 1988: 23-27

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