"Modeling Test Escape Rate as a Function of Multiple Coverages."

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena (2008)

Details and statistics

DOI: 10.1109/TEST.2008.4700605

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics