"SmartScan - Hierarchical test compression for pin-limited low power designs."

Krishna Chakravadhanula et al. (2013)

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DOI: 10.1109/TEST.2013.6651897

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj:
SmartScan - Hierarchical test compression for pin-limited low power designs. ITC 2013: 1-9

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