"Test Quality Improvement with Timing-aware ATPG: Screening small delay ..."

Che-Jen Jerry Chang, Takeo Kobayashi (2008)

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DOI: 10.1109/TEST.2008.4700702

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Che-Jen Jerry Chang, Takeo Kobayashi:
Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study. ITC 2008: 1

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