"A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High ..."

Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi (2004)

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DOI: 10.1109/TEST.2004.1387385

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117

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