"Predicting system-level test and in-field customer failures using data mining."

Harry H. Chen et al. (2013)

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DOI: 10.1109/TEST.2013.6651892

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Harry H. Chen, Roger Hsu, PaulYoung Yang, J. J. Shyr:
Predicting system-level test and in-field customer failures using data mining. ITC 2013: 1-10

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