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"Test and debug solutions for 3D-stacked integrated circuits."

Sergej Deutsch, Krishnendu Chakrabarty (2015)

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DOI: 10.1109/TEST.2015.7342421

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Sergej Deutsch, Krishnendu Chakrabarty:
Test and debug solutions for 3D-stacked integrated circuits. ITC 2015: 1-10

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