"Design of integrated circuits fully testable for delay-faults and multifaults."

Srinivas Devadas, Kurt Keutzer (1990)

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DOI: 10.1109/TEST.1990.114034

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Srinivas Devadas, Kurt Keutzer:
Design of integrated circuits fully testable for delay-faults and multifaults. ITC 1990: 284-293

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