"Accurate measurement of small delay defect coverage of test patterns."

Narendra Devta-Prasanna et al. (2009)

> Home

Details and statistics

DOI: 10.1109/TEST.2009.5355644

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/Devta-PrasannaGGWK09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Devta-PrasannaGGWK09
Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy:
Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.